Méndez-González, L. C., Rodriguez Picon, L. A., Perez Olguin, I. J. C., Pérez Domínguez, L., & Luviano Cruz, D. (2022). The alpha power Weibull transformation distribution applied to describe the behavior of electronic devices under voltage stress profile.
Chicago Style (17th ed.) CitationMéndez-González, Luis Carlos, Luis Alberto Rodriguez Picon, Ivan Juan Carlos Perez Olguin, Luis Pérez Domínguez, and David Luviano Cruz. The Alpha Power Weibull Transformation Distribution Applied to Describe the Behavior of Electronic Devices Under Voltage Stress Profile. 2022.
MLA引文Méndez-González, Luis Carlos, et al. The Alpha Power Weibull Transformation Distribution Applied to Describe the Behavior of Electronic Devices Under Voltage Stress Profile. 2022.
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