The alpha power Weibull transformation distribution applied to describe the behavior of electronic devices under voltage stress profile
This paper presents a life-stress methodology that models the failure rate in the form of a bathtub curve. The model consists of the Alpha Power Transformation (APT), which adds an extra parameter to the probability distributions to achieve better flexibility in the representation in the data an...
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| 其他作者: | , , , |
| 格式: | Artículo |
| 語言: | en_US |
| 出版: |
2022
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| 主題: | |
| 在線閱讀: | https://doi.org/10.1080/16843703.2022.2071526 https://www.tandfonline.com/doi/full/10.1080/16843703.2022.2071526 |
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| 總結: | This paper presents a life-stress methodology that models the failure rate
in the form of a bathtub curve. The model consists of the Alpha Power
Transformation (APT), which adds an extra parameter to the probability
distributions to achieve better flexibility in the representation in the data
analysis. To build the life–stress relationship, the APT is combined with the
Weibull Distribution (WD) and the Inverse Power Law (IPL) as a stress
model to relate the data from the accelerated life tests (ALT), thus presenting the APTW-IPL. Statistical properties of the APTW-IPL are analyzed
and discussed. For the parameter estimation of APTW-IPL, the Maximum
Likelihood Estimator was used. On the other hand, to test the efficacy of
the APTW-IPL, the model is compared with other methodologies that
describe the behavior of the bathtub curve in two case studies related
to determining the behavior of electronic devices that were subjected to
ALT. The results show that the APTW-IPL can be a good option for
reliability analysis in electronic devices. It represents the failure times in
the form of a bathtub curve, the value of MTTF, and fitting the distribution
to the case study data. |
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