The alpha power Weibull transformation distribution applied to describe the behavior of electronic devices under voltage stress profile

This paper presents a life-stress methodology that models the failure rate in the form of a bathtub curve. The model consists of the Alpha Power Transformation (APT), which adds an extra parameter to the probability distributions to achieve better flexibility in the representation in the data an...

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書誌詳細
第一著者:	Méndez-González, Luis Carlos
その他の著者:	Rodriguez Picon, Luis Alberto, Perez Olguin, Ivan Juan Carlos, Pérez Domínguez, Luis, Luviano Cruz, David
フォーマット:	Artículo
言語:	en_US
出版事項:	2022
主題:	info:eu-repo/classification/cti/7
オンライン･アクセス:	https://doi.org/10.1080/16843703.2022.2071526 https://www.tandfonline.com/doi/full/10.1080/16843703.2022.2071526
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