The alpha power Weibull transformation distribution applied to describe the behavior of electronic devices under voltage stress profile

This paper presents a life-stress methodology that models the failure rate in the form of a bathtub curve. The model consists of the Alpha Power Transformation (APT), which adds an extra parameter to the probability distributions to achieve better flexibility in the representation in the data an...

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Bibliografische gegevens
Hoofdauteur: Méndez-González, Luis Carlos
Andere auteurs: Rodriguez Picon, Luis Alberto, Perez Olguin, Ivan Juan Carlos, Pérez Domínguez, Luis, Luviano Cruz, David
Formaat: Artículo
Taal:en_US
Gepubliceerd in: 2022
Onderwerpen:
Online toegang:https://doi.org/10.1080/16843703.2022.2071526
https://www.tandfonline.com/doi/full/10.1080/16843703.2022.2071526
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