The alpha power Weibull transformation distribution applied to describe the behavior of electronic devices under voltage stress profile
This paper presents a life-stress methodology that models the failure rate in the form of a bathtub curve. The model consists of the Alpha Power Transformation (APT), which adds an extra parameter to the probability distributions to achieve better flexibility in the representation in the data an...
Сохранить в:
Главный автор: | Méndez-González, Luis Carlos |
---|---|
Другие авторы: | Rodriguez Picon, Luis Alberto, Perez Olguin, Ivan Juan Carlos, Pérez Domínguez, Luis, Luviano Cruz, David |
Формат: | Artículo |
Язык: | en_US |
Опубликовано: |
2022
|
Предметы: | |
Online-ссылка: | https://doi.org/10.1080/16843703.2022.2071526 https://www.tandfonline.com/doi/full/10.1080/16843703.2022.2071526 |
Метки: |
Добавить метку
Нет меток, Требуется 1-ая метка записи!
|
Схожие документы
-
A reliability analysis for electronic devices under an extension of exponentiated perks distribution
по: Méndez-González, Luis Carlos
Опубликовано: (2022) -
Reliability analysis using exponentiated Weibull distribution and inverse power law
по: Mendez Gonzalez, Luis Carlos
Опубликовано: (2019) -
Reliability analysis for DC motors under voltage step-stress scenario
по: Mendez Gonzalez, Luis Carlos
Опубликовано: (2020) -
Active power compensator for a DC voltage bus of a renewable source
по: Morfin, Onofre
Опубликовано: (2024) -
Weibull Analysis for Constant and Variant Stress Behavior Using the Alt Method for Single Stress and the Taguchi Method for Several Stress Variables
по: Piña Monarrez, Manuel Román
Опубликовано: (2018)