The alpha power Weibull transformation distribution applied to describe the behavior of electronic devices under voltage stress profile

This paper presents a life-stress methodology that models the failure rate in the form of a bathtub curve. The model consists of the Alpha Power Transformation (APT), which adds an extra parameter to the probability distributions to achieve better flexibility in the representation in the data an...

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主要作者: Méndez-González, Luis Carlos
其他作者: Rodriguez Picon, Luis Alberto, Perez Olguin, Ivan Juan Carlos, Pérez Domínguez, Luis, Luviano Cruz, David
格式: Artículo
語言:en_US
出版: 2022
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在線閱讀:https://doi.org/10.1080/16843703.2022.2071526
https://www.tandfonline.com/doi/full/10.1080/16843703.2022.2071526
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