A reliability analysis for electronic devices under an extension of exponentiated perks distribution
This paper presents a reliability analysis for electronic devices (ED) with bathtub curve-shaped failure times. An extension of the exponentiated perks distribution (EPD) is proposed for the analysis. The extension of this new distribution is based on the Alpha Power Transformation, so the Alpha...
Guardat en:
Autor principal: | Méndez-González, Luis Carlos |
---|---|
Altres autors: | Quezada Carreon, Abel Eduardo, Rodriguez Picon, Luis Alberto, Perez Olguin, Ivan Juan Carlos, García, Vicente |
Format: | Artículo |
Idioma: | English |
Publicat: |
2022
|
Matèries: | |
Accés en línia: | https://doi.org/10.1002/qre.3255 https://onlinelibrary.wiley.com/doi/10.1002/qre.3255 |
Etiquetes: |
Afegir etiqueta
Sense etiquetes, Sigues el primer a etiquetar aquest registre!
|
Ítems similars
-
An Additive Chen Distribution with Applications to Lifetime Data
per: Méndez-González, Luis Carlos
Publicat: (2023) -
Reliability analysis using exponentiated Weibull distribution and inverse power law
per: Mendez Gonzalez, Luis Carlos
Publicat: (2019) -
Reliability prediction for automotive electronics
per: Piña Monarrez, Manuel Román
Publicat: (2024) -
Probabilistic Weibull reliability of a shaft design subjected to bending and torsion stress
per: Piña Monarrez, Manuel Román
Publicat: (2024) -
A New Generalization of the Uniform Distribution: Properties and Applications to Lifetime Data
per: Méndez-González, Luis Carlos
Publicat: (2024)