A reliability analysis for electronic devices under an extension of exponentiated perks distribution

This paper presents a reliability analysis for electronic devices (ED) with bathtub curve-shaped failure times. An extension of the exponentiated perks distribution (EPD) is proposed for the analysis. The extension of this new distribution is based on the Alpha Power Transformation, so the Alpha...

全面介紹

Saved in:
書目詳細資料
主要作者: Méndez-González, Luis Carlos
其他作者: Quezada Carreon, Abel Eduardo, Rodriguez Picon, Luis Alberto, Perez Olguin, Ivan Juan Carlos, García, Vicente
格式: Artículo
語言:English
出版: 2022
主題:
在線閱讀:https://doi.org/10.1002/qre.3255
https://onlinelibrary.wiley.com/doi/10.1002/qre.3255
標簽: 添加標簽
沒有標簽, 成為第一個標記此記錄!

相似書籍