A reliability analysis for electronic devices under an extension of exponentiated perks distribution

This paper presents a reliability analysis for electronic devices (ED) with bathtub curve-shaped failure times. An extension of the exponentiated perks distribution (EPD) is proposed for the analysis. The extension of this new distribution is based on the Alpha Power Transformation, so the Alpha...

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主要作者: Méndez-González, Luis Carlos
其他作者: Quezada Carreon, Abel Eduardo, Rodriguez Picon, Luis Alberto, Perez Olguin, Ivan Juan Carlos, García, Vicente
格式: Artículo
语言:English
出版: 2022
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在线阅读:https://doi.org/10.1002/qre.3255
https://onlinelibrary.wiley.com/doi/10.1002/qre.3255
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