Study of indium tin oxide–MoS2 interface by atom probe tomography

The molybdenum disulfide (MoS2) and indium tin oxide (ITO) interface were studied by atom probe tomography (APT). Raman spectroscopy, scanning electron microscopy, and grazingincidence x-ray diffraction measurements were performed as complementary characterization. Results confirm that nanowires pla...

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Hlavní autor:	Ramos Murillo, Manuel Antonio
Další autoři:	Nogan, Jhon, Boll, Torben, Kauffmman-Weis, Sandra, Rodriguez Gonzalez, Claudia, Enriquez Carrejo, Jose Luis, Helmaier, Martin
Médium:	Artículo
Jazyk:	spa
Vydáno:	2019
Témata:	Indium tin oxide, MoS2, interface, atom probe info:eu-repo/classification/cti/7
On-line přístup:	https://doi.org/10.1557/mrc.2019.150 https://www.cambridge.org/core/journals/mrs-communications/article/study-of-indium-tin-oxidemos2-interface-by-atom-probe-tomography/C513A268D236C9B9204BA128250865D9
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Study of indium tin oxide–MoS2 interface by atom probe tomography

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