Study of indium tin oxide–MoS2 interface by atom probe tomography

Study of indium tin oxide–MoS2 interface by atom probe tomography

The molybdenum disulfide (MoS2) and indium tin oxide (ITO) interface were studied by atom probe tomography (APT). Raman spectroscopy, scanning electron microscopy, and grazingincidence x-ray diffraction measurements were performed as complementary characterization. Results confirm that nanowires pla...

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Bibliografske podrobnosti
Glavni avtor: Ramos Murillo, Manuel Antonio
Drugi avtorji: Nogan, Jhon, Boll, Torben, Kauffmman-Weis, Sandra, Rodriguez Gonzalez, Claudia, Enriquez Carrejo, Jose Luis, Helmaier, Martin
Format: Artículo
Jezik:spa
Izdano: 2019
Teme:
Indium tin oxide, MoS2, interface, atom probe
info:eu-repo/classification/cti/7
Online dostop:https://doi.org/10.1557/mrc.2019.150
https://www.cambridge.org/core/journals/mrs-communications/article/study-of-indium-tin-oxidemos2-interface-by-atom-probe-tomography/C513A268D236C9B9204BA128250865D9
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