Effect of ion bombardment on the chemical properties of crystalline tantalum pentoxide films
The effect of argon ion bombardment on the chemical properties of crystalline Ta2O5 films grown on Si(100) substrates by radio frequency magnetron sputtering was investigated by X-ray photoelectron spectroscopy. All samples were irradiated for several time intervals [(0.5, 3, 6, 9) min] and the Ta...
Saved in:
| 主要作者: | |
|---|---|
| 其他作者: | , , , , |
| 格式: | Artículo |
| 语言: | English |
| 出版: |
2019
|
| 主题: | |
| 在线阅读: | https://doi.org/10.1016/j.vacuum.2019.04.037 https://doi.org/10.1016/j.vacuum.2019.04.037 |
| 标签: |
添加标签
没有标签, 成为第一个标记此记录!
|
