Study of indium tin oxide–MoS2 interface by atom probe tomography
The molybdenum disulfide (MoS2) and indium tin oxide (ITO) interface were studied by atom probe tomography (APT). Raman spectroscopy, scanning electron microscopy, and grazingincidence x-ray diffraction measurements were performed as complementary characterization. Results confirm that nanowires pla...
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| その他の著者: | , , , , , |
| フォーマット: | Artículo |
| 言語: | spa |
| 出版事項: |
2019
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| 主題: | |
| オンライン･アクセス: | https://doi.org/10.1557/mrc.2019.150 https://www.cambridge.org/core/journals/mrs-communications/article/study-of-indium-tin-oxidemos2-interface-by-atom-probe-tomography/C513A268D236C9B9204BA128250865D9 |
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